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Technical/Catalog InformationHBCS-1100
VendorLite-On Inc
CategorySensors, Transducers
Sensing Distance0.168" (4.27mm)
Sensing MethodReflective
Output TypePhototransistor
Voltage - Collector Emitter Breakdown (Max)-
Current - Collector (Ic) (Max)8mA
Current - DC Forward (If)50mA
Response Time-
Operating Temperature-20°C ~ 70°C
FeaturesFocused Emitter and Detector
Mounting TypeThrough Hole
Package / CaseTO-5
PackagingBulk
Lead Free StatusLead Free
RoHS StatusRoHS Compliant
Other Names HBCS 1100
HBCS1100
516 1604 5 ND
51616045ND
516-1604-5
The HBCS-1100 is a fully integrated module designed for optical reflective sensing. The module contains a 0.178 mm (0.007 in.) diameter 700 nm visible LED emitter and a matched I.C. photodetector. A bifurcated aspheric lens is used to image the active areas of the emitter and the detector to a single spot 4.27 mm (0.168 in.) in front of the package. The reflected signal can be sensed directly from the photodiode or through an internal transistor that can be configured as a high gain amplifier.
Parameter Symbol Min. Max. Units Fig. Notes
Storage Temperature
TS -40 +75    
Operating Temperature TA -20 +70    
Lead Soldering Temperature
1.6 mm from Seating Plane
    260 for 10 sec.   11
Average LED Forward Current IF
  50 mA   2
Peak LED Forward Current IFPK   75 mA 1 1
Reverse LED Input Voltage VR   5 V    
Package Power Dissipation
PP   120 mW   3
Collector Output Current IO   8 mA    
Supply and Output Voltage VD, VC, VE -0.5 20 V   10
Transistor Base Current IB   5 mA    
Transistor Emitter Base Voltage VEB   0.5 V    
Applications include pattern recognition and verification, object sizing, optical limit switching, tachometry, textile thread counting and defect detection, dimensional monitoring, line locating, mark, and bar code scanning, and paper edge detection.
• Focused Emitter and Detector in a Single Package
• High Resolution–0.190 mm Spot Size
• 700 nm Visible Emitter
• Lens Filtered to Reject Ambient Light
• TO-5 Miniature Sealed Package
• Photodiode and Transistor Output
• Solid State Reliability
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